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dc.contributor.authorPätzold, Matthias
dc.contributor.authorCastillo, Javier Vázquez
dc.contributor.authorGutiérrez, Carlos A.
dc.contributor.authorMichel, Ramón Parra
dc.date.accessioned2012-08-17T11:12:50Z
dc.date.available2012-08-17T11:12:50Z
dc.date.issued2012
dc.identifier.citationPätzold, M., Castillo, J. V., Gutiérrez, C. A., & Michel, R. P. (2012). An exact solution for the level-crossing rate and the average duration of fades of the envelope of sum-of-cisoids processes. Procedia Technology, 3, 30-40. doi: 10.1016/j.protcy.2012.03.004no_NO
dc.identifier.issn2212-0173
dc.identifier.urihttp://hdl.handle.net/11250/137948
dc.descriptionAuthors version of an article published in the journal: Procedia Technology. Also available from the publisher at: http://dx.doi.org/10.1016/j.protcy.2012.03.004no_NO
dc.description.abstractSum-of-cisoids (SOC) processes provide a physically and numerically appealing framework for the modelling and simulation of a wide class of mobile radio channels. This paper is concerned with the problem of finding a general solution for the level-crossing rate (LCR) and the average duration of fades (ADF) of the envelope of SOC processes. Exact expressions are derived for the LCR and the ADF by taking into account that the inphase component, the quadrature component, and the time derivatives of the inphase and quadrature components of SOC processes are in general mutually correlated. The validity of the theoretical results is confirmed by simulation results. This study reveals new insight into the fading behaviour of SOS-based multipath fading channel models. The results of this study are indispensable for the performance assessment of mobile radio channel simulators employing the SOC principle.no_NO
dc.language.isoengno_NO
dc.publisherElsevierno_NO
dc.subjectmobile radio channelsno_NO
dc.subjectfading channel simulatorsno_NO
dc.subjectsum-of-sinusoidsno_NO
dc.subjectsum-of-cisoidsno_NO
dc.subjectlevel-crossing rateno_NO
dc.subjectaverage duration of fadesno_NO
dc.subjectRayleigh fadingno_NO
dc.subjectRice fadingno_NO
dc.titleAn exact solution for the level-crossing rate and the average duration of fades of the envelope of sum-of-cisoids processesno_NO
dc.typeJournal articleno_NO
dc.typePeer reviewedno_NO
dc.subject.nsiVDP::Mathematics and natural science: 400::Information and communication science: 420::Communication and distributed systems: 423no_NO
dc.subject.nsiVDP::Technology: 500::Information and communication technology: 550::Telecommunication: 552no_NO
dc.source.pagenumber30-40no_NO
dc.source.volume3no_NO
dc.source.journalProcedia Technologyno_NO


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