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An exact solution for the level-crossing rate and the average duration of fades of the envelope of sum-of-cisoids processes

Pätzold, Matthias; Castillo, Javier Vázquez; Gutiérrez, Carlos A.; Michel, Ramón Parra
Journal article, Peer reviewed
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Pätzold_2012_Exact.pdf (238.2Kb)
Contract_Pätzold_2012_Exact.pdf (462.0Kb)
Permanent lenke
http://hdl.handle.net/11250/137948
Utgivelsesdato
2012
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  • Scientific Publications in Information and Communication Technology [491]
Originalversjon
Pätzold, M., Castillo, J. V., Gutiérrez, C. A., & Michel, R. P. (2012). An exact solution for the level-crossing rate and the average duration of fades of the envelope of sum-of-cisoids processes. Procedia Technology, 3, 30-40. doi: 10.1016/j.protcy.2012.03.004  
Sammendrag
Sum-of-cisoids (SOC) processes provide a physically and numerically appealing framework for the modelling and simulation of a wide class of mobile radio channels. This paper is concerned with the problem of finding a general solution for the level-crossing rate (LCR) and the average duration of fades (ADF) of the envelope of SOC processes. Exact expressions are derived for the LCR and the ADF by taking into account that the inphase component, the quadrature component, and the time derivatives of the inphase and quadrature components of SOC processes are in general mutually correlated. The validity of the theoretical results is confirmed by simulation results. This study reveals new insight into the fading behaviour of SOS-based multipath fading channel models. The results of this study are indispensable for the performance assessment of mobile radio channel simulators employing the SOC principle.
Beskrivelse
Authors version of an article published in the journal: Procedia Technology. Also available from the publisher at: http://dx.doi.org/10.1016/j.protcy.2012.03.004
Utgiver
Elsevier
Tidsskrift
Procedia Technology

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