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Pattern classification using a new border identification paradigm: The nearest border technique

dc.contributor.authorLi, Yifeng
dc.contributor.authorOommen, John
dc.contributor.authorNgom, Alioune
dc.contributor.authorRueda, Luis
dc.date.accessioned2016-09-16T15:15:37Z
dc.date.accessioned2016-10-19T12:52:49Z
dc.date.available2016-09-16T15:15:37Z
dc.date.available2016-10-19T12:52:49Z
dc.date.issued2015
dc.identifier.issn0925-2312
dc.identifier.urihttp://hdl.handle.net/11250/2416401
dc.description-
dc.language.isoengnb_NO
dc.titlePattern classification using a new border identification paradigm: The nearest border techniquenb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.date.updated2016-09-16T15:15:37Z
dc.identifier.doi10.1016/j.neucom.2015.01.030
dc.identifier.cristin1253477


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