• A new paradigm for pattern classification: Nearest Border Techniques 

      Li, Yifeng; Oommen, B. John; Ngom, Alioune; Rueda, Luis (Lecture Notes in Computer Science;8272, Chapter; Peer reviewed, 2013)
      There are many paradigms for pattern classification. As opposed to these, this paper introduces a paradigm that has not been reported in the literature earlier, which we shall refer to as the Nearest Border (NB) paradigm. ...