Long term stability testing of oxide unicouple thermoelectric modules
dc.contributor.author | Skomedal, Gunstein | |
dc.contributor.author | Vehus, Tore | |
dc.contributor.author | Kanas, Nikola | |
dc.contributor.author | Singh, Sathya Prakash | |
dc.contributor.author | Einarsrud, Mari-Ann | |
dc.contributor.author | Wiik, Kjell | |
dc.contributor.author | Middleton, Peter Hugh | |
dc.date.accessioned | 2020-03-30T08:28:33Z | |
dc.date.available | 2020-03-30T08:28:33Z | |
dc.date.created | 2019-11-21T11:18:53Z | |
dc.date.issued | 2019 | |
dc.identifier.citation | Skomedal, G., Vehus, T., Kanas, N., Singh, Sathya P., Einarsrud, M.- A., Wiik, K. & Middleton, Peter H. (2019). Long term stability testing of oxide unicouple thermoelectric modules. Materials Today: Proceedings, 8 (2), 696-705. doi: | en_US |
dc.identifier.issn | 2214-7853 | |
dc.identifier.uri | https://hdl.handle.net/11250/2649300 | |
dc.language.iso | eng | en_US |
dc.publisher | Elsevier | en_US |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/deed.no | * |
dc.title | Long term stability testing of oxide unicouple thermoelectric modules | en_US |
dc.type | Peer reviewed | en_US |
dc.type | Journal article | en_US |
dc.description.version | publishedVersion | en_US |
dc.rights.holder | © 2019 The Author(s) | en_US |
dc.subject.nsi | VDP::Teknologi: 500 | en_US |
dc.source.pagenumber | 696-705 | en_US |
dc.source.volume | 8 | en_US |
dc.source.journal | Materials Today: Proceedings | en_US |
dc.source.issue | 2 | en_US |
dc.identifier.doi | 10.1016/j.matpr.2019.02.070 | |
dc.identifier.cristin | 1750367 | |
dc.relation.project | Norges forskningsråd: 228854 | en_US |
cristin.qualitycode | 1 |