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dc.contributor.authorSkomedal, Gunstein
dc.contributor.authorKristiansen, Nils R.
dc.contributor.authorEngvoll, Marianne
dc.contributor.authorMiddleton, Hugh
dc.date.accessioned2014-03-21T12:11:48Z
dc.date.available2014-03-21T12:11:48Z
dc.date.issued2013
dc.identifier.citationSkomedal, G., Kristiansen, N. R., Engvoll, M., & Middleton, H. (2013). Methods for enhancing the thermal durability of high-temperature thermoelectric materials. Journal of Electronic Materials, 1-6. doi: 10.1007/s11664-013-2917-0nb_NO
dc.identifier.issn0361-5235
dc.identifier.urihttp://hdl.handle.net/11250/192815
dc.descriptionAuthor's version of an article in the journal: Journal of Electronic Materials. Also available from the publisher at: http://dx.doi.org/10.1007/s11664-013-2917-0nb_NO
dc.description.abstractThermoelectric materials, for example skutterudites and magnesium silicides, are being investigated as promising materials for medium-to-high-temperature waste heat recovery in transport and in industry. A crucial aspect of the success of a thermoelectric material is its stability over time when exposed to rapid heating and cooling. In this work different aspects of the degradation of these thermoelectric materials at high temperature were examined. Initial thermal durability was studied, and several candidate coatings were evaluated to enhance durability by protecting the materials from oxidation and sublimation during thermal cycles in air for up to 500 h and up to 873 K. The samples were characterized by SEM and EDS. The results showed it is possible to reduce degradation of the thermoelectric material without compromising overall thermoelectric efficiency.nb_NO
dc.language.isoengnb_NO
dc.publisherInstitute of Electrical and Electronics Engineersnb_NO
dc.subjectVDP::Teknologi: 500::Elektrotekniske fag: 540nb_NO
dc.subjectSkutteruditenb_NO
dc.subjectmagnesium silicidenb_NO
dc.subjectoxidationnb_NO
dc.subjectdurabilitynb_NO
dc.subjectcoatingnb_NO
dc.titleMethods for enhancing the thermal durability of high-temperature thermoelectric materialsnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.source.pagenumber1-6nb_NO
dc.source.journalJournal of Electronic Materialsnb_NO
dc.identifier.doi10.1007/s11664-013-2917-0


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