• Metric learning method aided data-driven design of fault detection systems 

      Yan, Guoyang; Mei, Jiangyuan; Yin, Shen; Karimi, Hamid Reza (Journal article; Peer reviewed, 2014)
      Fault detection is fundamental to many industrial applications. With the development of system complexity, the number of sensors is increasing, which makes traditional fault detection methods lose efficiency. Metric learning ...